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NOVÉ TRENDY VE FYZICE |
SEKCE 4 - ABSTRAKTY
TMAVÁ VIDOVÁ SPEKTROSKOPIE PLANÁRNÍCH VLNOVODNÝCH STRUKTUR
Ondřej Bárta, Jaromír Pištora, František Staněk, Michal Lesňák
Hornicko-geologická fakulta
17. listopadu 15, 708 33 Ostrava-Poruba,
Česká republika
Telefon: 00-420-69-699 3129, Fax: 00-420-69-691 8589
e-mail: ondrej.barta@vsb.cz, jaromir.pistora@vsb.cz
Abstract
This work presents light propagation in waveguide planar structures modulated by prism coupler. On the base of Yeh’s matrix formalism the theoretical aspects of prism coupler are briefly discussed. Experimental possibilities of Dark Mode Spectroscopy are demonstrated on diagnostics of real waveguide structure and some interesting results are presented. Mathematical background of experimental analysis is studied in detail.
MAKROSKOPICKÉ VYSVĚTLENÍ ROZLIŠOVACÍ SCHOPNOSTI RASTROVACÍHO OPTICKÉHO TUNELOVÉHO MIKROSKOPU
Benešová Markéta+, Dobis Pavel*, Tománek Pavel*
Vysoké učení technické v Brně
+Fakulta strojního inženýrství
Technická 2, 616 69 Brno, Česká republika
* Fakulta elektrotechniky a informatiky, Ústav fyziky
Technická 8, 616 00 Brno, Česká republika
e-mail: dobis@dphys.fee.vutbr.cz
Abstract
A model based on macroscopic approach for calculating the images obtained in scanning tunneling optical microscopy is proposed. We show that the lateral resolution is limited neither by the wavelength nor by the decay length of the evanescent wave but that it is determined by the tip-sample distance.
DETERMINATION OF MECHANICAL PROPERTIES OF THIN FILMS BY INDENTATION TECHNIQUES
Vilma Buršíková a,Vladislav
Navrátil b
aDepartment of Physical
Electronics, Faculty of Science,
Masaryk
University, Kotlářská 2, 611 37 Brno
Tel:00-420-5-41129569,
Fax:00-420-41211214
e-mail:vilmab@physics.muni.cz
bDepartment of Physics,
Faculty of Education,
Masaryk University, Poříčí 7,603 00 Brno
Abstract
In the present paper the indentation techniques as a powerful thin film characterisation tools will be introduced. The objective of our study is to determinate the mechanical properties of a number of different coating-substrate systems by means of both micro and nanoindentation techniques.
POLYSILANES IN ORGANIC-INORGANIC MATRICES
Norbert Dokoupil, Ivo Kuritka and Frantisek Schauer
Institute
of Physical and Applied Chemistry, Faculty of Chemistry, Brno University of
Technology, e-mail: dokoupil@fch.vutbr.cz
Abstract
Polysilanes with various silicon structure dimensionality were fabricated by using microwave electron cyclotron resonance plasma enhanced chemical vapour deposition (MW ECR PE CVD). The silicon dimensionality is strongly affected by the change of plasma deposition conditions. In this paper the impact of structural changes on photoluminescence (PL) is examined.
DIFFRACTIVE OPTICS: ANALYSIS, DESIGN AND FABRICATION OF DIFFRACTIVE OPTICAL ELEMENTS
Pavel Fiala*,
František Matějka+, Ivan Richter*, and Marek Škereň*
*Czech Technical
University in Prague, Faculty of Nuclear Sciences and Physical Engineering,
Department of Physical Electronics, Břehová 7, 11519 Prague l, Czech Republic
Phone: +4202-2191 2273, Email: fiala@troja.fjfi.cvut.cz
+Institute
of Scientific Instruments, Academy of Sciences of the Czech Republic,
Královopolská
147, 612 64 Brno, , Czech Republic
Phone: +4205-4151 4221, Email: matejka@ISIBrno.Cz
Abstract
This contribution presents results obtained in the field of diffractive optics, covering practically all aspects of the analysis, design and realization process of the diffractive optical elements (DOEs). As for the analysis, using the rigorous diffraction methods, we have recently been able to efficiently analyze various diffraction gratings. Concerning the synthesis, several design strategies have been studied and implemented for designing both binary and multi-level phase DOEs. Using the numerically computed designs, E-beam lithography technology has been chosen for fabricating both binary and multi-level phase DOEs, using the BS 600 e-beam lithographic facility at ISI AS CR. Finally, some typical examples of optical reconstructions are presented and discussed.
MEASUREMENT OF THE OPTICAL TRAP STIFFNESS
Petr Jákla,b, Alexandr Jonášb, Pavel Zemánekb, Miroslav Liškaa
Brno University of
Technology, Technická 2, 616 69 Brno, Czech Republic
bInstitute
of Scientific Instruments, Academy of Sciences of the Czech Republic,
Královopolská 147, 612 64 Brno, Czech Republic
Telefon: 00-420-5-4151 4284,
Fax: 00-420-5-4151 4402
e-mail:jakl@isibrno.cz
Abstrakt
An optical trap for dielectric microparticles is usually approximated by a parabolic potential well, whose profile is characterized by a single constant – trap stiffness. This stiffness can be estimated using several methods, including Fourier spectral analysis of the thermal noise of the trapped particle position, or method based on equipartition theorem. The principles of the trap calibration and experimental results are presented.
STUDY OF THE BEHAVIOR OF MICROPARTICLE IN THE STANDING WAVE TRAP
Jan Ježeka,b, Alexandr Jonášb, Pavel Zemánekb, Miroslav Liškaa
Brno University of
Technology, Technická 2, 616 69 Brno, Czech Republic
bInstitute
of Scientific Instruments, Academy of Sciences of the Czech Republic,
Královopolská 147, 612 64 Brno, Czech Republic
e-mail:
jezek@isibrno.cz
Abstrakt
The basic behavior of microparticles placed in the Gaussian standing wave is studied theoretically and experimentally in this article. It is shown that the optical force depends periodically on the particle size and, as the consequence, the equilibrium object position is alternating between the standing wave antinodes and nodes. For certain particle sizes, the particle confinement is disabled. Experimental confirmation of the theoretical results is briefly discussed.
STUDIUM ULTRATENKÝCH VRSTEVNATÝCH STRUKTUR
Patrik Jurkovič, Jan Čechal, Petr Bábor a Tomáš Šikola
Vysoké
učení technické v Brně
Fakulta strojního inženýrství
Ústav fyzikálního inženýrství
Technická 2, 616 69 Brno, Česká republika
Telefon: 00-420-5-4114 2849
e-mail:jurkovic@fyzika.fme.vutbr.cz
Abstract
Článek se zabývá využitím metody AR XPS pro analýzu chemického složení vrstvy přírodního oxidu na substrátech Si. Teorie maximální entropie byla použita při následné rekonstrukci hloubkového profilu vzorku.
NONCONTACT SCANNING FORCE MICROSCOPY – PRINCIPLES AND SIMULATIONS
Radek Kalousek, Vladan Buš, David Škoda and Tomáš Šikola
Institute of
Physical Engineering, Faculty of Mechanical Engineering, Brno University of
Technology, Technická 2, Brno 616 69 E-mail: kalousek@ufi.fme.vutbr.cz
Abstract
In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.
DIGITAL IMAGING PROCESSING IN SCANNING PROBE MICROSCOPY
Dana Košťálová
Faculty of Electrical Engineering and Computer Science
Department of
Physics
Technická 8,
616 00, Czech Republic
e-mail: kostala@dphys.fee.vutbr.cz
Abstract
This article is concerned with a time dependent processing of the image. The Scanning Probe Microscopy (SPM) data transfer is rather slow and requires computers to store data and to process image and display it. All processes make noise and deviations of image and then must be chosen suitable methods of processing. On the other hand shapes must be very often simplified.
APLIKACE AFM PŘI STUDIU POVRCHŮ A NANOČÁSTIC OXIDŮ ŽELEZA
Roman Kubínek, Milan Vůjtek, Renata Holubová
Univerzita Palackého v Olomouci
Přírodovědecká fakulta
Katedra experimentální fyziky
tř. Svobody 26, 771 46 Olomouc, Česká republika
e-mail:kubinek@sloup.upol.cz (http://atmilab.upol.cz/)
Abstrakt
The atomic force microscope (AFM) belongs to the new family of scanning probe microscopes (SPM). Contribution is a review of our applications of AFM Explorer at surface study of solid conductive and non-conductive samples. The interesting application of AFM is analysis of iron oxide nanoparticles and morphological characteristics study in dependence on condition of their preparation.
NEAR FIELD OPTICAL BEAM INDUCED CURRENT MEASUREMENTS ON HETEROSTRUCTURES
Petr Létal, Pavel Tománek, Lubomír Grmela
Brno University of Technology
Faculty of Electrical Engineering and Computer Science
Technická 8, 616 00 Brno
phone: + 420 5 4114 3279, fax: +
420 5 4114 3133,
e-mail: tomanek@dphys.fee.vutbr.cz
Abstrakt
We report near field optical beam induced current (NOBIC) measurements on semiconductor quantum well (QW) structures. A sub-wavelength fiber tip is coupled with a tunable laser source and scanned over a sample surface. The induced photocurrent reveals the compositional profile of quantum structures. We demonstrated that the resolution of this technique depends strongly on the aperture size.
FABRICATION OF NANOSTRUCTURES BY AFM LOCAL OXIDATION
Filip Lopour, David Škoda and Tomáš Šikola
Institute of Physical Engineering
Faculty of Mechanical Engineering, Brno University of Technology
Phone: +420 5 4114 2707, Fax:
+420 5 4114 2842
e-mail: lopour@fyzika.fme.vutbr.cz
Abstrakt
In the paper AFM studies of nanostructures produced by AFM local anodic oxidation of Ti thin films is presented. It was proved that the height of Ti oxide lines fabricated by AFM increases linearly with the voltage between a tip and a sample. On the other hand, the half-width of the lines did not depend linearly on this voltage. The results are useful for studies of quantum effects in nanostructures and experiments in fabrication of nanoelectronic devices (e.g. SET).
DESIGN OF PIEZOCERAMIC MANIPULATORS FOR AN APPLICATION IN SPM INSTRUMENTS
Karel Pátík, Filip Lopour,
and Tomáš Šikola
Brno Technical University
Faculty of Mechanical Engineering
Institute of Physical Engineering
Technická 2, 616 69 Brno, Czech Republic
Tel.: 00-420-5-4114 2782
e-mail: patik@fyzika.fme.vutbr.cz
Abstract
In this paper piezoelectric driven devices used for translation of the samples or other components both in atmospheric and UHV environments, especially in Scanning Probe Microscopy (SPM), are reported. The fundamental view of these actuators and a design of a compact micromanipulator for an AFM/STM unit are presented.
APPLICATION OF ToF – LEIS FOR ANALYSIS OF SURFACES AND ULTRA THIN FILMS
StanislavPrůša, Petr Bábor
and Tomáš Šikola
Brno University of Technology
Institute of Physical Engineering
Technická 2, 616 00 Brno, Česká republika
Telefon: 00-420-5-4114 2832, Fax: 00-420-5-4114 2842
e-mail: prusa@fyzika.fme.vutbr.cz
Abstract
Low Energy Ion Scattering (LEIS) belongs to a wide group of surface science analytical techniques. Low detection limit and extreme surface sensitivity are the main advantages of LEIS. Atomic composition of analysed surfaces is determined from the energy distribution of the scattered rare gas ions. Their kinetic energy can be measured by a Time-of-Flight (ToF) spectrometer. Capabilities of the ToF LEIS spectrometer will be demonstrated at analysis of gallium layers evaporated on a SiO2 substrate.
MEASUREMENT OF INTENSITY PROFILE IN THE FOCAL REGION OF MICROSCOPE OBJECTIVE
Mojmír Šerýa,b, Jan Ježeka,b,
Petr Jákla,b, Alexandr Jonáša, Pavel
Zemáneka , Miroslav Liškab
aInstitute of Scientific Instruments, Academy of
Sciences of the Czech Republic, Královopolská 147, 612 64 Brno, Czech Republic
e-mail:sery@isibrno.cz
Abstract
This work describes an experimental method for the measurement of the profile of the laser beam focused by an immersion microscope objective. The method makes use of the two-photon excited fluorescence emitted by a 200 nm dyed polystyrene bead fixed to the cover slip. A piezo driven stage is used for scanning of the bead through the focal volume of an infrared laser beam and the excited two-photon fluorescence is detected by a photomultiplier.
APPLICATION OF SPECTROSCOPIC ELLIPSOMETRY IN ULTRA-THIN FILM ANALYSIS
Petr Tichopádeka, Jan
Čechalb, Alois Nebojsac, Tomáš Šikolad
aInstitute of Physical Engineering, Brno University of Technology, Brno,
Czech Republic, tel.:00-420-5-49122175, e-mail: tichopadek@ufi.fme.vutbr.cz
bInstitute of Physical Engineering, Brno University of Technology, Brno,
Czech Republic, tel.:00-420-5-41142850, e-mail: cechal@fyzika.fme.vutbr.cz
cLaboratory of Thin Films and Nanostructures, Masaryk
University, Brno, Czech Republic, tel.:00-420-5-41129471, e-mail nebojsa@physics.muni.cz
dInstitute of Physical Engineering, Brno University of Technology, Brno,
Czech Republic, tel.:00-420-5-41142707, e-mail: sikola@fyzika.fme.vutbr.cz
Abstract
Ellipsometry has become a popular tool for a study of optical properties of thin films and surfaces. Ex situ experiments were carried out on thermally grown silicon dioxides and native silicon oxides by etching the samples in a HF based solution. The oxide layers were measured by spectroscopic ellipsometry and AR XPS.
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Upraveno 24.10.2001
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